Used HITACHI RS 5500 #9249276 for sale

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ID: 9249276
Wafer Size: 12"
Vintage: 2011
Scanning Electron Microscope (SEM), 12" 2011 vintage.
HITACHI RS 5500 scanning electron microscope (SEM) is a state-of-the-art imaging device that is ideal for inspecting a wide range of sample types. This high-resolution imaging equipment features a field emission gun for enhanced image clarity and resolution up to 3 nanometers. The device is optimal for examining a variety of materials, from biological structures to composite materials, as well as working in a variety of environmental conditions. With its multiple beam modes, HITACHI RS5500 is highly versatile and can readily adapt to any research or imaging project. The advanced design of the SEM ensures efficient operation and performance, as well as rapid image acquisition. It has an electron gun that is electronically focused and has a working distance of 130mm. In addition, the device includes an auto-probe current function that effectively regulates the electron beam intensity and ensures consistency throughout the analysis. Through this advanced technology, the device maintains precise imaging accuracy and reduces errors from external sources. As a high-performance SEM, RS-5500 has an impressive vacuum system that offers a base pressure of up to 5 × 10−7 Pa. Combined with a unique objective polepiece, this advanced unit contributes to better imaging capabilities as well as higher contrast imaging even at lower magnifications. The advanced control machine of RS5500 also plays a pivotal role in its performance. The user interface is designed to be intuitive for effective and productive operation. In addition, the device utilizes an advanced signal control tool that combines digital techniques for improved performance. To maximize its efficiency, the SEM is equipped with a highly sensitive imaging unit, which helps to optimize evaluation. In conclusion, RS 5500 is equipped with top-of-the-line features and is ideal for obtaining reliable and accurate imaging. It has an impressive resolution of up to 3 nanometers and utilizes a field emission gun for greater clarity and contrast. In addition, its powerful vacuum asset offers a base pressure of up to 5 × 10−7 pa, while its advanced signal control model ensures optimal operation and reliability.
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