Used HITACHI RS7000-30 #113465 for sale

HITACHI RS7000-30 is an advanced analytical scanning electron microscope (SEM) designed to meet the rigorous demands of today's materials scientists. Its modern design and bespoke software bring an unparalleled level of accuracy and ease-of-use to the electron microscopy industry. RS7000-30 consists of a high-vacuum chamber, an electron source and a detectors assembly, all housed in a rigid stainless steel body. It is powered by a 200kW DC pulsed power supply, capable of operating at up to 3600V and 40 mA. This provides excellent performance for both high resolution imaging and nano-scale surface analysis. HITACHI RS7000-30's high-resolution imaging capabilities allow it to visualize the nanometer size features of individual particles, from the surface to the interior, with an attainable resolution of 0.8 nm. This makes it an invaluable tool for observing, characterizing, and analyzing small particles, structural defects and surface characteristics on the nano-scale. For surface analysis, RS7000-30 is equipped with an EDS detector, enabling the determination of compound composition and elemental composition of any given sample. This makes the instrument ideal for the characterization of the elemental makeup of small samples, making it capable of handling both difficult and complex tasks with accuracy, precision and repeatability. HITACHI RS7000-30 also features a dedicated software, providing users with data analysis, 3D imaging and real-time automation. This allows users to perform operations such as repeat scanning, and particles/defect counting in a high-speed, fully automated fashion. This saves time while offering superior accuracy and flexibility, and is ideal for high throughput applications. Overall, RS7000-30 is an excellent choice for the rigorous demands of materials scientists. Its excellent performance and versatility, combined with an easy-to-use software system, mean that it is a reliable and powerful tool for high-resolution imaging, surface analysis and automated sample characterization.