Used HITACHI RS7000-30 #113469 for sale

HITACHI RS7000-30 is a scanning electron microscope (SEM) designed to enhance research capabilities in a wide variety of fields. Operating at 30 kV, this SEM offers high resolution imaging and secondary electron imaging of light element samples. This instrument is capable of providing visual interaction with a sample, in addition to collecting high resolution images, while still boasting high throughput capabilities. In order to provide fast imaging of samples, RS7000-30 is equipped with a high-resolution imaging equipment. This system can image particles as small as one nanometer across the full field of view. Additionally, the 3D imaging unit of this SEM is useful for obtaining quantitative results such as measurements of depth and surface topography. The optimized imaging technology provided by HITACHI RS7000-30 also offers solutions for phase imaging and microanalysis applications. For researchers interested in high resolution elemental analyses, RS7000-30 provides exceptional performance. The secondary electron imaging and diffraction capabilities of this instrument allow researchers to perform elemental analysis of light elements, such as hydrogen and lithium, with high accuracy and precision. Additionally, HITACHI RS7000-30 SEM provides several modes for conducting Energy Dispersive X-ray (EDX) Analysis. These include standard, high resolution, low background, and high speed modes. This comprehensive EDX spectrum allows users to get a better understanding of their sample composition. RS7000-30 SEM also offers enhanced capabilities for production applications. It features a highly automated operation mode that enables faster measurement sequences and the flexible workflow help ensure consistent results. The fully automated machine also offers an easy-to-use interface and can be integrated with other instruments for predictable, repeatable results. Overall, HITACHI RS7000-30 Scanning Electron Microscope is a powerful instrument for both research and production applications. This innovative SEM offers high resolution imaging, a versatile workflow, and a range of analysis capabilities for light elements. Additionally, its easy-to-use interface allows researchers to perform fast and accurate measurements of samples.