Used HITACHI RS7500-20 #113471 for sale

HITACHI RS7500-20
ID: 113471
Vintage: 1997
tester 2 left, 2 right Software version 5.31 Controller labeler Loader / unloader conveyor: long Warehoused 1997 vintage.
HITACHI RS7500-20 is a scanning electron microscope (SEM) that combines advanced imaging capabilities with high performance and reliability. This instrument is capable of producing high-resolution images of nanometer-scale features with unprecedented accuracy and fidelity. The electron microscope utilizes a conventional Schottky Field Emission Source (FES) to generate a focused electron beam with a minimum beam spot size of less than 1 nanometer. It is equipped with an electromagnetic objective lens that enables a maximum magnification of more than 10 million times. Additionally, the microscope has an integrated high-resolution digital camera attachment for acquiring digital images with resolution of up to 5000 pixels across its field of view. The instrument is designed for use in a variety of scanning electron microscopy applications, including surface investigations of nanoscale devices, materials analysis, failure analysis and characterization. The instrument provides imaging modes for both monochromatic and color imaging. The instrument is equipped with multiple user-selectable automation and sample manipulation features that enable rapid routine operation. It is also equipped with a range of advanced software features, including automated sample alignment and automated data processing. RS7500-20 is also compatible with a wide range of accessories and sample holders, including STEM holders, sample holders for liquid or powder samples, or a variety of other types of holders. Additionally, the microscope is equipped with an integrated electronic motorized stage and sample manipulator that enables users to rotate, tilt, and move samples during analysis. This advanced scanning electron microscope is a reliable and powerful instrument that provides users with an extremely versatile imaging platform. It is an ideal tool for a variety of materials science and research applications and offers unparalleled imaging capabilities and resolution.
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