Used HITACHI S-2400 #9158565 for sale

HITACHI S-2400 scanning electron microscope is an advanced imaging system for the visualization and analysis of intricate micro-detail on a wide range of materials. S-2400 utilizes a combination of field emission electron optics, an electron gun and a standing wave-type phase-shift deflector. This system allows for high-resolution imaging and enhanced depth of information. With its micro-imaging capabilities and nanoscale sensitivity, HITACHI S-2400 has been used to study specimens as small as nanometers in size. S-2400 has several advantages for electron imaging. First, because it uses the electron gun and field emission optics, HITACHI S-2400 provides a wide magnifying range, allowing for high-resolution imaging of large areas with just one sample. Second, the standing wave-type phase-shift deflector is highly accurate and enables precise measurements of the electrons path and their interactions with the sample. Third, S-2400 features a low background noise level, a significant advantage over rival scanning electron microscopes. HITACHI S-2400, like other scanning electron microscopes, has an in-sample, electron-beam sensitivity. This sensitivity enables extremely detailed images and precise measurements at nanoscale resolution. Additionally, S-2400's increased depth of field allows for the study of three-dimensional specimens, alleviating the issue of topographical distortion caused by the shallow depth of field of other electron microscopes. Furthermore, HITACHI S-2400 has a highly-conductive specimen mounting solution and is ideal for imaging conductive samples. Moreover, the combination of the standing wave-type phase-shift deflector, sample auto-loading and positioning mechanisms, and high-speed image-acquisition mode makes S-2400 ideal for multi-field observations. Finally, HITACHI S-2400 includes an array of sample-preparation and imaging attachables, including high-vacuum pumping systems, sample heating systems and imaging environmental chambers. All in all, S-2400 scanning electron microscope is an invaluable tool for the study of intricate micro- and nano-scale specimens. With its wide magnifying range, low noise level and advanced electron-beam sensitivity, HITACHI S-2400 is well-suited for a wide variety of applications in microscopy and analysis.