Used HITACHI S-2400 #9225172 for sale

ID: 9225172
Vintage: 1991
Scanning Electron Microscope (SEM) 1991 vintage.
HITACHI S-2400 scanning electron microscope (SEM) is a versatile and powerful imaging equipment that allows for the detailed analysis of micro- and nanoscale surfaces.S-2400 is an advanced SEM platform that offers both high resolution imaging and intricate, three-dimensional (3D) analysis. HITACHI S-2400 is designed to provide extremely high spatial resolution with the ability to magnify objects up to 500,000 times their original size. The imaging system allows for both SEM and low-voltage beam emission. Additionally, the unit is capable of a wide range of analytical measurements, from electron energy loss spectroscopy (EELS) to cathodoluminescence. The machine can operate in either high-vacuum or low-vacuum modes for a variety of applications. When in low-vacuum mode, S-2400's beam current can be adjusted to provide a range of images with high resolution and contrast. To acquire 3D images, the tool can incorporate an energy filtering transmission electron microscope (EFTEM). HITACHI S-2400's advanced rotation mechanics allow for easy manipulation of samples during imaging. Users can employ a variety of tilting options - up to 90 degrees in the x and y coordinates and up to 70 degrees in the z coordinate. By employing an automated scan controller, S-2400 allows for rapid acquisition of non-planar images. The asset includes an intuitive software suite that makes it easy to process and analyze images. Software tools can automatically detect particles and determine particle size distributions. Additionally, HITACHI S-2400 includes an extensive library of automated SEM images that allow comparisons between images. S-2400 is the ideal scanning electron microscope for detailed analysis of micro- and nanoscale surfaces. Its advanced capabilities and intuitive software make it a powerful imaging model for a variety of analytical purposes. HITACHI S-2400 is a reliable and precise imaging equipment that can be used to collect detailed information and images from precise samples.
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