Used HITACHI S-2400 #9294571 for sale

ID: 9294571
Scanning Electron Microscope (SEM) Cables are nonfunctional.
HITACHI S-2400 is a scanning electron microscope (SEM) used for scientific and industrial imaging applications. The microscope can achieve higher magnifications and resolutions than conventional optical microscopes. It is an advanced instrument for high-resolution imaging, allowing for surface and elemental identification of samples at a range of magnifications. S-2400 is equipped with a wide-angle field emission gun (WAFEG) for high sensitivity and contrasted imaging. This allows for imaging of non-conductive samples without spread of charged particles. The incident electron beam energy is variable up to 15k eV, allowing for multiple imaging modes and applications. The microscope also features a low-vacuum operating state down to 10-6 Pa, allowing for imaging of samples in atmosphere. This makes HITACHI S-2400 ideal for observing biological and other samples that cannot be observed in a vacuum. The unit boasts a superior resolution of 1nm with a 4k CCD and high scan rate for quick specimen imaging. Coupled with the built-in digital interface, S-2400 can be operated remotely, and data can be transferred and processed more easily. The microscope also features a series of advanced operating modes. These include pre-programmed image acquisition sequences, enabling users to analyze multiple images with one click. It is also equipped with a Flexible Image Acquisition System, allowing for higher magnifications in longer scans. In addition, HITACHI S-2400 allows for automated waviness and Zernike measurements of features like grating or flatness. As a result, the microscope can be used for measuring of variations and surface topography. In conclusion, S-2400 is a high performance scanning electron microscope suited for scientific and industrial applications. It offers a wide range of advanced imaging capabilities and operating modes, making it ideal for those looking for high magnification and excellent resolution for detailed analysis.
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