Used HITACHI S-2460N #9139355 for sale
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ID: 9139355
Scanning electron microscope (SEM)
Oxford Detector
Robinson Back Scatter
Robinson Chamber Scope Camera
EDS
Secondary Electron
PCI.
HITACHI S-2460N is a scanning electron microscope (SEM) that is renowned for its outstanding ability to provide high resolution images. The instrument is equipped with a projection electron column (PEC) that provides excellent imaging performance with increased depth of field and resolution. This SEM also has a high magnification capability, delivering high-detail observations. In addition, its integrated imaging equipment allows for a full range of resolution and magnification settings. S-2460N scanning electron microscope incorporates advanced functions such as electrical interference suppression system (EIS), variable spot-scanning mode and digital collision current control unit (DCCS). The EIS machine provides for interference-free image quality, while the variable-spot scanning mode can be effectively used to observe specimens in detail. Moreover, its digital collision current control tool (DCCS) provides digital control over the electron beam current, enabling precise adjustments for long term operation. Furthermore, the microscope has a built-in image processing asset for image optimization. The instrument comes with an automated sample loader, enabling quick and simple sample examination. It also features the ability to take measurements and evaluate specimen surfaces. HITACHI S-2460N also utilizes a three-step specimen-to-image translation station which automatically moves and positions the specimen to the required plane. The station also has an automated alignment that is designed to reduce setup time and simplify image transfers. S-2460N also has an integrated communication port that allows for easy data transfer and remote operation. Its user-friendly interface makes it simple to interpret and interpret data, analysis and images. The scanning electron microscope is also equipped with a low-dose rate function, which reduces specimen damage. Overall, HITACHI S-2460N is an advanced scanning electron microscope with an impressive array of features. Its stable performance, high capability and user-friendly features make it an ideal choice for a wide range of applications, providing extraordinary imaging performance for truly accurate results.
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