Used HITACHI S-2500 #9071216 for sale

HITACHI S-2500 scanning electron microscope (SEM) is a high performance scanning electron microscope with enhanced resolution and performance. It is designed with unique features and capabilities such as high resolution imaging, advanced in-lens secondary electron detectors, and an automated scan controller. HITACHI S 2500 utilizes a unique electron optical design that allows for excellent resolution levels, resulting in clear images. It has a built-in high-performance variable pressure secondary electron imaging (VPI-SEI) detector, providing high-resolution images with contrast control over a wide magnification range. The in-lens electron analyzer has been designed to detect a variety of energy dependent signals such as Auger electrons and X-rays. This feature coupled with the capability to perform horizontal and tilting rotary scans provides the users with enhanced imaging capabilities. S-2500 incorporating a scan controller allows for highly automated scan operations. This equipment is stored internally and allows users to set and store multiple scan parameters including scan speed, size, and resolution. The controller also provides a high level of image analysis software, which can be used to acquire images as well as perform data and statistical analysis on the acquired data. The system has fifteen total detectors, of which three are dedicated to high-resolution imaging, nine are designed for electron localized magnetic anlysis (LEMA), three for in-lens electron energy spectra (LCEDS), and three for X-ray mapping. This wide variety of detectors ensures that users can perform a wide range of experiments on all types of samples. Beyond the variety of imaging modes, S 2500 also provides options for automatic sample alignment and mechanical stages. It is also equipped with the latest in sample holders such as dual-level holders, motorized manipulators, and quick-mount holders. HITACHI S-2500 also offers a suite of automated software options that further assist the user, eliminating much of the complexity associated with SEM operation. These options include automated scan routines, calibration, and an automated sample alignment unit. HITACHI S 2500 is an ideal tool for nanocharacterization of virtually any type of sample. It is an intuitive and easy-to-use machine that can quickly produce high-resolution images with minimal user input. Further, its automated features help expedite the acquisition of features from complex sample while still providing the highest quality imaging and analysis.