Used HITACHI S-2600H #293617185 for sale

HITACHI S-2600H is a type of scanning electron microscope (SEM) designed for high-resolution imaging, sample observation, and analysis. It utilizes all the necessary components for traditional SEM operation—including electron beam, vacuum equipment, sample holder, detection system, and computer control—to provide maximum accuracy and precision when viewing a given sample. This SEM is equipped with a field emission gun (FEG) electron source which allows for bright, high-energy electron beams. The FEG gives a low source life, providing long term stability and high resolution imaging. S-2600H is capable of imaging small features, including those with a diameter less than 1nm, as well as larger features. The images are incredibly clear, revealing details such as internal surface roughness and other characteristics. Sample images can be acquired under various operating conditions as well, such as low vacuum or high vacuum. This allows the user to obtain high-resolution images regardless of the sample material. HITACHI S-2600H comes with a built-in image processing software suite which allows the user to easily make measurements and calculations. This is especially useful for materials research, with images easily able to be compared and analyzed to determine the shape, size, orientation, and other characteristics of a sample. The software suite also allows for the creation of 3D images, giving a vivid representation of the sample's structure. Lastly, S-2600H is also equipped with a specimen autofocus unit. This servo driven machine uses feedback from the scanner to accurately adjust the focus of the image to maximize image resolution. This prevents the need for manual focus adjustments, ensuring that the highest resolution images are achieved each time. HITACHI S-2600H is a high quality scanning electron microscope which provides the user with superior imaging and analysis capabilities. With its wide array of features and components, it can help with a variety of applications in the materials research and analysis field.