Used HITACHI S-2600N #293626644 for sale

HITACHI S-2600N Scanning Electron Microscope (SEM) is an excellent tool for high resolution micro-imaging and analysis. The microscope provides an excellent magnification range from 7x to 600,000x, and an exceptional depth of field for imaging. The scanning electron beam is able to generate secondary electron images which provide excellent surface detail. The specimen can also be accurately located and centered within the field of view and the edge detection abilities of S-2600N ensure stable imaging conditions. HITACHI S-2600N has a powerful accelerating voltage range between 0.3 and 10 kV and an excellent spot size of less than 5 nanometers. With an automatic focus control feature in the microscope, users can easily adjust the focus and position of the sample. Samples can be rendered in both bright and darkfield mode for excellent contrast in the displayed images. S-2600N has a range of many imaging and analysis capabilities, including scanning electron diffraction (SED) for crystallographic analysis. The user can also select from a variety of detectors to optimize the structure and composition data from the sample. The detection range includes backscattered electrons, secondary electrons, Auger electrons, and X-rays. The specimen chamber accommodates up to three different stages for use in imaging and analysis. An auto-stage helps to take full advantage of the magnifications available, with features that simplify the process of sample positioning and alignment in the chamber. The microscope also comes with a variety of detectors and holders, allowing fast and easy sample importation. Finally, HITACHI S-2600N has outstanding environmental control and vacuum capabilities, allowing users to examine specimens in peak condition without worrying about air interference. The vacuum system is able to reach pressures as low as 0.10 Pa, and the environmental chamber is temperature and pH regulated to maintain the highest quality of specimens. The combination of all these features make S-2600N an ideal instrument for SEM imaging and analysis.