Used HITACHI S-2600N #293657550 for sale
URL successfully copied!
Tap to zoom
ID: 293657550
Scanning Electron Microscope (SEM)
SE and BSE Detectors
Manual stage
Does not include EDS.
HITACHI S-2600N is a scanning electron microscope (SEM) designed for high sample throughput and precision imaging. It is equipped with a wide variety of features that facilitate high-resolution imaging and advanced measurement techniques. S-2600N features a field emission gun (FEG) electron source, which delivers an exceptionally high resolution of up to 0.8nm, as well as a high charging-stability circuit for greater sample stability. This higher resolution allows users to image finer features and produce higher quality results. The FEG also offers a wide range of accelerating voltages, from 30kV to 8kV. HITACHI S-2600N also offers an ultramagnification-over-perfect-field (Uperf) capability that can achieve resolutions up to 0.36nm, with a larger depth of field than conventional SEM. This extends the range of samples that can be studied with S-2600N and makes detailed observations easier. HITACHI S-2600N is also equipped with a Z-piezo motor stage for high precision x-y movement. This allows for rapid positioning and stage-montage capabilities, which is essential for automated sample preparation processes. Additionally, the Z-piezo motor stage offers alignment and motion control accuracy up to 10nm, allowing for accurate sample positioning for very fine sample analysis. S-2600N also features a newly designed gas detector equipment, which is capable of detecting minute composition changes in gas emitted from any given sample. Using this system, it is possible to analyse elements such as carbon, oxygen, and nitrogen, giving researchers better insights on sample composition and chemical reactions. HITACHI S-2600N is also designed with a robust vacuum unit that minimizes sample contamination and maintains dynamic vacuum levels for extended periods of time. This machine allows for longer working times than other SEMs, allowing for more detailed examination of samples. Overall, S-2600N is an advanced scanning electron microscope for a variety of application and research needs. Its combination of resolution, cleanliness, and extended working times make it an ideal solution for researchers looking to achieve detailed and precise imaging.
There are no reviews yet