Used HITACHI S-2700 #9200117 for sale

HITACHI S-2700 is a scanning electron microscope (SEM) used for detailed surface observations, analysis, and imaging. It is an advanced instrument that enables high resolution imaging and analysis of samples on a very fine scale. S-2700 provides superior image resolution down to a level of 0.3 nanometers. It is equipped with an ultra-high voltage electron gun with acceleration voltages up to 200kV for greater image contrast and detailed imaging. HITACHI S-2700 offers a wide range of advanced features including variable chamber geometry, secondary electron imaging, backscattered electron imaging, and analysis capabilities such as digital image analysis (DIA) and line scan for quantitative analysis. Moreover, it is also equipped with a fully equipped vacuum system for efficient and accurate sample preparation. The sample chamber of S-2700 facilitates its smooth operation. By using the air-bearing scanning stage, sample manipulation is made easier and precise. The sample can be monitored in any direction with the sample chamber's X and Y axes. Additionally, the Z axis allows for focusing according to the desired image. This helps in obtaining the maximum image resolution, usually obtained during extended duration of imaging. The system uses the energy dispersive spectroscopy (EDS) and electron backscattered diffraction (EBSD) capabilities to acquire more detailed analysis of the sample structure. This provides a better understanding of the sample's composition and crystalline structure. Also, HITACHI S-2700 can detect even faint elemental signals with its highly sensitive electron beam detectors. Additionally, S-2700 also features automated image stitching and post-image processing tools for more accurate analysis and interpretation. The sample chamber is also configured to be compatible with various accessories used for scanning electron microscopy such as cryo-transfer stages, detectors, and film holders. In conclusion, HITACHI S-2700 is a powerful tool for obtaining detailed analysis and imaging of sample surfaces. Its advanced detection capabilities, variable chamber geometry, post-imaging processing tools, and automated image stitching make it a preferred SEM instrument for detailed surface analysis. S-2700 provides repeatable results with its accurate sample manipulation and resolution down to 0.3 nanometers.