Used HITACHI S-3000 #9409097 for sale

HITACHI S-3000 scanning electron microscope (SEM) is a versatile imaging instrument that can provide high-resolution images for a variety of biological, industrial and scientific applications. S-3000 is a monocular, cathode ray tube (CRT) source instrument, equipped with a 2-stage DC Scan generator, column controller, orientation controller, and electron gun with motorized control. This allows greater flexibility in imaging conditions, allowing users to observe and measure more features with greater accuracy. HITACHI S-3000 features an integrated detector system, enabling the viewing of secondary electrons, backscattered electrons and reflected X-rays. The four detector types and multiple poles on the detector sides, both right and left, enable optimal imaging for the desired application. The integrated detector system also allows for the detection of transmitted electrons, in addition to the secondary and backscattered electrons. Also integrated into the design is a 5-position rotary waver stage, providing sample stability, further increasing accuracy and utility of results. S-3000 also provides a variety of imaging modes with adjustable parameters. In Fixed-Wobble mode, the incident beam remains in one area of the sample, continually scanning in a fixed pattern for greater uniformity. The Variable-Wobble mode allows for a greater range of study, as the incident beam moves across the sample in a series of overlapping scans. The Integral Mode simulates a real-world scanning process by moving across the sample in an S-shaped pattern, scanning all areas of a sample evenly. HITACHI S-3000 also supports a range of visual outputs. Images can be viewed directly on the CRT, observed on a monitor with S-3000's high-resolution video output, or printed using one of the built-in hardcopy functions. Thanks to the column controller, HITACHI S-3000 also has a built-in vacuum subsystem, allowing the user to adjust ion current and magnification, further increasing its versatility. In conclusion, the versatile S-3000 scanning electron microscope enables users to gain a clearer understanding of the physical and organizations of the studied material on a micro-scale. Its versatile imaging modes, adjustable parameters, integrated detectors, and the vacuum subsystem provide greater accuracy, stability and convenience, generating high-quality results for a variety of scientific and industrial applications.