Used HITACHI S-3000H #293596949 for sale

HITACHI S-3000H is a scanning electron microscope (SEM) designed for enhanced performance and ultra-high resolution imaging of materials at the nanometer level. It is specifically designed for semiconductor and high-density circuit applications and provides optimized imaging for a variety of samples. HITACHI S 3000 H features an in-column energy filter and a hybrid imaging equipment that offers both secondary electron and backscattered electron imaging. This system is capable of capturing very high-resolution images of the surface and subsurface of a material which can be used for a variety of applications including electrical, electronic, chemical, metallurgical, and biomedical research. S-3000H is composed of four main components: a scanning electron column, a focussing lens, an in-column energy filter, and a detector. The scanning electron column utilizes aluminized sample chamber and features a high angle incident electron unit to enable the device to accurately scan the surface of the sample. Additionally, this machine is equipped with a large variable field of view allowing for rapid imaging and a very stable beam shape. The focussing lens is optimized for low aberration and is designed to reduce chromatic and spherical aberrations. This ensures that high resolution images with minimum distortion can be produced. The in-column energy filter takes advantage of the electron energy that is used to scan the sample. This energy can be controlled to analyze different modes of operation on the sample surface such as energy dispersive X-ray spectroscopic analysis (EDX) and secondary electron imaging. These modes enable S 3000 H to visualize and examine the composition of different components as well as microstructure of the sample with high accuracy. Furthermore, the detector is capable of detecting electrons backscattered from the sample surface and producing high-quality images of the same. HITACHI S-3000H is also equipped with a very adjustable optical tool which adds to its accuracy and resolution. This optical asset allows for the adjustment of spot size from 1000 nm to 10 μm and depth of field from 5 nm to 15 μm. Moreover, the device can also reach a numerical aperture of up to 0.6 which further increases the accuracy of imaging systems at nanometer levels. The combination of the in-column energy filter, the adjustable optical model and the advanced detector provides HITACHI S 3000 H an enhanced level of resolution that allows it to produce images with a resolution of up to one nanometer. In conclusion, S-3000H scanning electron microscope offers a very advanced level of imaging which is ideal for a variety of research and analysis of materials features at the nanometer-scale. Its in-column energy filter and adjustable optical equipment provide S 3000 H with a resolution of up to one nanometer and makes it ideal for detailed imaging and analysis of surface and subsurface features in a variety of applications.