Used HITACHI S-3000H #293597903 for sale
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ID: 293597903
Vintage: 2010
Scanning Electron Microscope (SEM)
Tungsten gun
EDS Type: LN2
SE Detector: High
Magnification range: 300.000x
Operating system:
SEM: Windows XP
EDS: Windows XP
2010 vintage.
HITACHI S-3000H Scanning Electron Microscope is a high resolution, wide field imaging device with powerful optics, equipped with advanced electron detection systems. With the combination of advanced electronic imaging technology and powerful optics, HITACHI S 3000 H is designed to provide detailed ultra-high resolution imaging of samples in an extremely short time. S-3000H features a high resolution field emission electron column with an accelerating voltage ranging from 0.5 keV to 30 keV. The high resolution detector is capable of increasing detection sensitivity and reducing image noise. The specimen stage can be scanned from 10 x to 90 x magnification. An integrated beam alignment system provides adjustable beam converging angle, ensuring an ideal sample surface for imaging. The advanced stage system allows for rapid specimen scanning in direct-view mode, which provides uniform irradiation over the sample in less time than conventional methods. This reduces vibration effects and provides good stability and uniformity when scanning. Furthermore, its large aperture allows for both object-to-objec t and sample-to-background imaging. The powerful optics of S 3000 H allows for clear imaging of particles as small as 0.1µm, making it an ideal instrument for investigating various areas of material science such as materials-based microstructures, components of an alloy, and different phases of a material. In addition, HITACHI S-3000H offers a big advantage in the analysis of particles, contamination, and failure analysis. Overall, HITACHI S 3000 H Scanning Electron Microscope is the perfect tool for high resolution imaging and microscopic analysis. It offers superior imaging quality, increased image resolution and sensitivity, and low maintenance requirements. Equipped with advanced electron detection systems, it allows for detailed study of a wide variety of samples in a faster and easier manner.
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