Used HITACHI S-3000H #9235998 for sale

HITACHI S-3000H scanning electron microscope (SEM) is a digital microscope designed for high performance imaging and analysis with a wide range of materials, including biological matter. This SEM model is able to capture a large range of signals from both chemical and physical phenomena due to its high sensitivity. It features a newly developed, high thermal stability electron source, offering stable operation and an excellent image resolution. This SEM delivers features optimized for a variety of sample environments due to its short pulse width, providing the best combination of image resolution and minimal sample damage. HITACHI S 3000 H is fitted with a low-vacuum, cold field emission gun (CFEG) that provides extremely high sensitivity and stability in the micro-electrical measurements presented at S-3000H. The CFEG allows for more delicate, sensitive sample imaging and superior image resolution as the emitted electrons from the CFEG focus in a very small spot, contributing to a powerful resolving power. Furthermore, various accessories can be added on to S 3000 H; this includes energy-dispersive X-ray spectrometer (EDS) capabilities, a top-of-the-line, high-resolution spectral imaging detector for electron backscatter imaging (EBI) and an in-lens secondary electron (SE) detector. HITACHI S-3000H's advanced imaging capabilities are largely attributed to the atomic-level precision that is achieved by its combination of improved detection system and variable primary-field imaging capabilities. This SEM offers ultra-high resolution imaging at just 2,000 times magnification and magnifies light with no deformation from lenses. Furthermore, HITACHI S 3000 H provides excellent signal processing capabilities for accelerated, accurate analysis through its in-built computer and software. S-3000H is designed with user safety in mind, fitted with an ion-gauge controller for sample protection from the high-intensity electron beam. Its external shield has been designed to fully encase the entire microscope setup for added operator safety and convenience. Additionally, this microscope has a built-in ion-gauge that monitors the vacuum level in the instrument and a timer that ensures the primary gun current is halted should the ion gauge fail. S 3000 H scanning electron microscope model is the premier choice for scientists and researchers looking to take their work to the next level, providing a high performing, reliable, and safe instrument for imaging and analysis. Its powerful resolution, variable primary-field imaging capabilities, and versatile software and detection system make it the perfect tool for modern research.