Used HITACHI S-3000H #9236136 for sale
URL successfully copied!
Tap to zoom
ID: 9236136
Vintage: 2006
Scanning Electron Microscope (SEM)
Secondary electron image resolution: 3.5 nm High vacuum mode
Reflected electron image resolution: 4.5 nm Low vacuum mode
Magnification: 15x~300,000x (65 Stages)
Electron optical system:
Filament:
Pre-center type
Tungsten hairpin
Gun bias with fixed bias
Gun alignment: Electromagnetic two-stage deflection
Condenser lens: Electromagnetic two-stage
Objective lens: Super conical lens
Objective lens diaphragm: 4 Holes movable
Astigmatism correction: Electromagnetic 8 poles
Image shift: ±20um (W.D: 15mm)
Accelerating voltage:
0.3~30kV (1171 Stages)
0.3~9.99kV (10V Step)
10~30kV (0.1kV Step)
Illumination current: 1012~10-7A
2006 vintage.
HITACHI S-3000H is a sophisticated scanning electron microscope (SEM) used extensively in materials research. This microscope is a field emission type, meaning it uses an electron beam generated by field emission from a tungsten emitter in order to form an image. It is a high-performance SEM capable of a high degree of resolution and magnification. HITACHI S 3000 H is fitted with a large chamber which allows for a wide range of analysis. The chamber itself has a maximum size of 150 mm in diameter and 200 mm in depth, allowing for a large working space for samples to be scanned. The microscope is designed to be able to scan surfaces at resolutions up to 30 nm with magnifications from 8x to 250,000x. It is supplemented with an automated stage allowing users to produce high resolution images extremely quickly. S-3000H also has a low accelerating voltage range which allows for a wide range of functional capabilities. This includes exploring surface structure and elemental composition, probing the surface of a sample with various beams such as X-ray, and low voltage SEM imaging. To increase the efficiency of the imaging process, S 3000 H is fitted with a number of advanced technologies such as variable pressure electron microscopy (VPE) and environmental scanning electron microscopy (ESEM). These technologies help to improve the quality of the images produced by the microscope allowing for higher resolution. In terms of safety, HITACHI S-3000H is designed with an interlock equipment which minimizes the risks associated with operating such a powerful instrument. The system will detect and shut off the electron gun if any of the safety parameters deviate from the preset values. To ensure that data is stored and kept safe it has an internal data storage unit which is unique to HITACHI S 3000 H. There is an onboard computer which can store up to 1 TB of data with options to back up data on to external storage devices or a dedicated server. Overall S-3000H is a sophisticated scanning electron microscope which is designed with powerful imaging capabilities. It has a large working chamber, allowing for a wide range of sample analysis and a low accelerating voltage range suitable for various types of imaging. It is fitted with an interlock machine for safety and reliable data storage capabilities, making it an ideal choice for materials research.
There are no reviews yet