Used HITACHI S-3000H #9309415 for sale

HITACHI S-3000H is a scanning electron microscope (SEM) designed to provide high-resolution imagery of specimens on the nanometric scale. This instrument uses a focused beam of electrons to scan a specimen's surface to create a highly detailed image. This SEM was modeled around the design of the popular SEM, the S-3000N, and is highly upgradable to improve its scanning accuracy and resolution as needed. It also has an intuitive user interface that makes performing scanning electron microscopy processes efficient and straightforward. This SEM utilizes a high-energy electron beam to directly interact with the sample and generate a wide variety of signals, such as secondary electrons, backscattered electrons, and the X-ray spectrum. This helps to provide realistic composition information that other optical microscopes cannot detect. HITACHI S 3000 H also has high imaging speeds and can be used for both high-temperature and low-temperature scanning. S-3000H's microanalysis capabilities make it ideal for a wide variety of applications, such as material science, medical science, research and development, and general microscopic analysis. It can be used to analyze a sample's microstructure, measure its electrical and mechanical properties, and detect defects in its surface layers. This SEM has a maximum resolution of up to 1 nm, so you can achieve a high-accuracy picture without needing to increase the beam voltage, which can be very damaging to the sample. Additionally, this microscope is equipped with an auto-focusing function that adjusts the focal point as needed, preventing any distortions of the image that can occur due to misalignment. S 3000 H can also be configured to work as a variable-pressure system. This feature lowers the risk of surface charging and increases the SEM's imaging performance when the sample's surface is sensitive, or when the sample environment is variable. Finally, HITACHI S-3000H is also fitted with an energy reducing filter, which blocks harmful ionizing radiation from entering the environment or affecting the samples. This increases the safety of the instrument's operation and reduces the environmental impact of using it.