Used HITACHI S-3000N #293668111 for sale

HITACHI S-3000N is a scanning electron microscope (SEM) well-suited for general purpose materials analysis. This instrument is equipped with a high-performance everhart-thornley type secondary electron (SE) detector, allowing for images with exceptional quality and detail. HITACHI S-3000 N is also equipped with an electron beam column designed to operate in a wide range of accelerating voltage outputs, from 0.5 to 30 kV. This range allows researchers to examine a wide variety of materials, including both organic and inorganic samples. S 3000 N also features an optional backscatter electron detector (BSD), allowing researchers to investigate surface characteristics of different specimens. This advanced electron optics equipment is capable of providing powerful magnification capabilities while maintaining excellent image resolution, allowing researchers to accurately visualize even small details in their specimens. In addition, its sophisticated electron column design enables the user to make precise adjustments in the beam spot size, ranging from a smallest spot size of 1.7 nm up to 30 nm, allowing a wide variety of samples to be examined in detail. HITACHI S 3000 N also features a wide range of sample chambers and accessories, such as a standard sample stub, sample tilt, sample bracker, and sample stage. The integrated sample chamber is designed to allow for easy loading and manipulation of a variety of specimens, with improved sample automation resulting in more consistent and accurate results. Furthermore, the chamber is equipped with two large-bore specimen holders which allow for multiple specimen holders to be installed at the same time. S-3000N is also designed to maintain excellent measurement accuracy using a linear motor drive system for XY stage control with a minimum increase of a few nanometers. Additionally, the unit is equipped with a cold field emission gun (FEG) capable of producing field of view with an impressive image resolution even in the low-kV region. S-3000 N can achieve good focus stability on specimens, with a focus stability management machine that enables for a highly stable sample imaging environment. This tool accurately tracks and compensates for changes in the sample position, resulting in a large number of repeatable images without needing frequent adjustments. The electronic and software aspects of HITACHI S-3000N are also worth mentioning. Not only does the software provide an intuitive user interface and a wide array of analysis tools, but it is also capable of data acquisition through USB/RS232 interfaces and is fully compatible with PC systems. All in all, HITACHI S-3000 N is a great choice for researchers looking for a high-quality SEM that offers a wide array of features and capabilities.