Used HITACHI S-3000N #293670616 for sale

ID: 293670616
Scanning Electron Microscope (SEM).
HITACHI S-3000N is a highly advanced scanning electron microscope (SEM) designed with both the latest technology and a variety of features to facilitate fully automated sample analysis. It is capable of imaging and measuring specimens with atomic resolutions. HITACHI S-3000 N utilizes a high vacuum environment to enable in-depth investigations of even the smallest of samples. The cold field emission gun (FEG) electron gun has an extremely precise beam shape and is capable of producing high resolution images with a high 2nm level of depth resolution. It also comes with an automated energy supertransfer image system that combines analytical and imaging capabilities. In addition to its powerful electron gun, S 3000 N offers a wide range of analysis functionality for sample investigation. It comes with an optional BF/DF detection option with surface and inclination angle mapping for more accurate and detailed measurements of surface features. Analysis can also be performed on thin films, alloys, insulators, ceramics, and polymers. HITACHI S 3000 N is equipped with a high-performance camera system, X-ray EDX, and autoloader for automated specimen analysis. Its built-in automated sample sizing feature reduces setup time and enhances performance. Its X-ray EDX system makes it possible to analyze the elements present within a specimen. S-3000N also comes with a variety of user-friendly features. Its intuitive graphical user interface (GUI) helps users navigate and control the instrument quickly and easily. A display monitor with a high resolution of 1024 x768 pixels provides excellent image quality for quick assessment of results. S-3000 N is an exceptional scanning electron microscope that provides robust imaging and analysis capabilities for sample investigation. Its advanced electron gun and multiple detection options make it ideal for analyzing a wide variety of specimens, while its user-friendly features enable easier and more efficient operation and sample analysis.
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