Used HITACHI S-3000N #293748791 for sale

HITACHI S-3000N is a scanning electron microscope (SEM) that is equipped with high-end analytical performance and advanced ergonomics to deliver an ideal solution for intuitive, efficient and high-quality imaging. It is suitable for various industries, such as materials science, nanotechnology, semiconductor, life science, and electronics. HITACHI S-3000 N utilizes variable pressure (VP) SEM technology, allowing for higher image quality, more detailed information and faster processing, even for samples with a large range of surface topology. This helps to obtain optimum results, even from ex vivo samples. It also features a direct electron detector, which helps to reduce X-ray noise and achieve higher quality imaging at magnifications up to 300Kx. S 3000 N has a high resolution field emission electron source and Xenon lockable condenser lens which helps to reduce image blur and contamination. In addition, its sample loading and stage control systems streamline the imaging workflow by providing fast, repeatable sample positioning and improved specimen handling capabilities. HITACHI S 3000 N also has a comprehensive suite of analytical capabilities including energy dispersive X-ray analysis (EDXA), energy-filtered imaging (EFI), scanning transmission electron microscopy (STEM), and electron backscatter diffraction (EBSD). This suite of analytical techniques allows for imaging of nanostructures, as well as elemental and chemical composition as well as phase variations in the material and crystal structure. Finally, S-3000 N features a fully automated operation with customizable user setup, allowing for ultrafast imaging. It also features advanced software for data processing and automated report generation. This advanced software enables the acquisition of larger data sets, faster imaging, data processing and analysis of larger data sets, and the ability to generate reports quickly and efficiently. Overall, S-3000N is a highly advanced imaging system that enables users to access high-end analytical performance and advanced ergonomics in order to acquire superior images and higher quality results, even from ex vivo samples. Its variable pressure (VP) SEM technology, direct electron detector, high resolution field emission electron source, Xenon lockable condenser lens, and single-button automated scanning provides reliable performance and intuitive operation. Furthermore, its comprehensive analytical suite, automated operation, and advanced software for data processing and automated reporting provides intuitive, efficient and high-quality imaging, making it the ideal solution for a variety of imaging applications.