Used HITACHI S-3000N #9156366 for sale

HITACHI S-3000N is a high-performance scanning electron microscope (SEM) that performs a variety of imaging tasks. It is capable of scanning, imaging, and manipulating materials as small as 1.0 nm in size. The electron gun of the microscope produces a high-powered beam of electrons which is then focused and scanned across the sample to generate a detailed virtual image. The sample is then exposed to the electron beam, which interacts with the electrons in the sample and produces a signal that is detected by a digital imaging system. HITACHI S-3000 N has a built-in scanning system which allows it to have a short acquisition and analysis time. It features a digital signal processor (DSP), which works alongside an image sensor to provide image data with a resolution up to 0.3 nm. This allows the user to image and analyze extremely small features that are difficult to distinguish with standard SEMs. S 3000 N has a wide range of capabilities for characterizing crystals and nanostructures. Its advanced analysis functions allow characterization of crystal structure, surface morphology, and compositional information. The SEM includes a high-resolution (HR) detector, which offers improved secondary electron sensitivity for the analysis of very small features. The HR detector also provides improved contrast and depth in the image, allowing users to identify hidden features, such as cracks, gaps, and scratches. In addition to its imaging capabilities, S-3000 N features focused ion beam (FIB) capabilities. FIB technology enables the user to modify and machine a sample surface through the direct writing, etching, and deposition of ions. This allows them to quickly clean, modify, and characterize fine features in the sample. The FIB tool also lets the user analyze the spectral and chemical composition of the sample by using energy-dispersive X-ray spectroscopy (EDS). S-3000N also comes with a variety of different stages and holders, which lets the user select a suitable orientation and environmental conditions for their sample. These stages and holders include motorized, three-axis (x, y, and z) stages, as well as low-vacuum stages that are designed to maximize SEM efficiency, allowing the user to acquire large areas quickly. Overall, HITACHI S 3000 N is an advanced scanning electron microscope that can provide detailed images of very small objects and structures. Its high magnification and wide range of analysis functions make it an ideal choice for scientists studying and researching the nano world.