Used HITACHI S-3000N #9169037 for sale

ID: 9169037
Vintage: 2004
Field emission scanning electron microscope (FE-SEM) P/N: 03E-0601 2004 vintage.
HITACHI S-3000N is a high-resolution scanning electron microscope (SEM). This microscope is the latest and most advanced of HITACHI models, designed to provide superior imaging capabilities. It is capable of producing micrographs with outstanding resolution, high contrast, and true color reproduction. This microscope utilizes a field-emission electron gun, which produces a focused beam of electrons with a high current density and is capable of providing up to 10kV of accelerating voltage with variable focus. This electron beam is scanned over a surface, with the presence of a detector enabling the collection of secondary electrons, back-scattered electrons, and characteristic X-rays generated by the specimen. The resulting images allow for the analysis and identification of features, elements, and composition of a sample. HITACHI S-3000 N has a fully automated large vacuum chamber and incorporates an auto-focus feature, enabling superior image clarity at low and high magnifications. It has an array of user-friendly features and scanning modes, making it an optimal instrument for performing electron microscopy experiments. This microscope also features an integrated microanalysis system, which allows for X-ray spectroscopy, energy-dispersive spectroscopy (EDS), and wavelength-dispersive spectroscopy (WDS). The high resolution and versatility of this scanning electron microscope make it an ideal choice for a wide variety of research applications. It is capable of observing geometrical structures and microscopic defects in solid materials, including metals, ceramics, composites, and semiconductors, as well as biological samples such as cells, microorganisms, and plant matter. Overall, S 3000 N is an excellent scanning electron microscope that combines outstanding imaging with versatile supplemental analysis tools. Its versatility and ease of use make it ideal for use in many different research settings.
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