Used HITACHI S-3000N #9171724 for sale

HITACHI S-3000N
ID: 9171724
Vintage: 2005
Scanning electron microscope 2005 vintage.
HITACHI S-3000N is an advanced scanning electron microscope (SEM) designed for a wide range of applications in semiconductor and materials science research. HITACHI S-3000 N incorporates cutting-edge electron optics, detector technology, and software to enable high-resolution imaging and analytical capability. It features a column with cutting-edge electron optics and a high-precision, low-noise scanning generator, which offer high-resolution imaging and analytical capability for large samples up to 120 mm. A variable stage is designed to allow for imaging samples of variable dimensions. S 3000 N also features an innovative 'Health Monitor' system, which monitors the performance levels of the SEM to ensure that it maintains optimum performance. This system can track performance levels over time and alert the user when maintenance is required. It also comes with a suite of software packages to enable advanced analysis of materials, including electron diffraction analysis to provide detailed information regarding crystal structures; energy-dispersive X-ray spectroscopy (EDS) to identify elemental composition; and electron backscatter diffraction (EBSD) to measure the crystallographic orientation of materials. Furthermore, it features a 'LiveView' system, which allows the user to view a series of images in real time as they are acquired, allowing for rapid analysis and feedback. S-3000 N is an advanced and versatile tool for the study of materials, offering high-resolution imaging, analytical capability, and rapid response for both large and small samples. With an intuitive user interface and an array of advanced features, S-3000N provides scientists with an unmatched level of control and precision.
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