Used HITACHI S-3000N #9176872 for sale
URL successfully copied!
ID: 9176872
Vintage: 2001
Scanning electron microscope (SEM)
Compaq computer for SEM operation:
OS: Windows NT
HP Computer for EDS operation:
OS: Windows 2000 with EDAX
SONY SSM-930 B&W Monitor
Robinson chamber view CCD camera
(2) HITACHI VR16-K Vacuum pumps
FRANKLIN ELECTRIC Electric pump
HASKRIS Chiller
HITACHI SEM Manual
Various spare parts
Flat screen monitor included
Resolutions:
Secondary electron image resolution: 3.5 nm (High vacuum mode)
Back-scattered electron image resolution: 5.0 nm (Variable pressure mode)
Magnification: 15x to 300,000x (65 Steps)
Electron optics:
Filament: Pre-centered tungsten hairpin type
Gun bias: Self-bias + Continuously variable bias
Emission current: 10^-12 to 10^-7 A
Gun alignment: 2-Stage electromagnetic alignment
Condenser lens: 2-Stage electromagnetic condenser
Objective lens: Super conical lens
Objective lens aperture: (4) Opening movable apertures
Stigmator coil: 8-Pole electromagnetic X / Y correction for astigmatism
Image shift: +/- 20 um or more (W.D= 15 mm)
Accelerating voltages:
3.0 to 30 kV (1,171 Steps)
0.3 to 9.99 kV (In increments of 10 V)
10 to 30 kV (In increments of 0.1 kV)
2001 vintage.
HITACHI S-3000N scanning electron microscope (SEM) is an advanced imaging and analysis equipment designed for superior performance in a range of research and industrial applications. The system combines a large chamber, improved stability and shielding, and a host of features designed for careful, accurate imaging, analysis, and evaluation. The SEM has an accelerate voltage range of 5 kV to 30 kV, enabling observation of sample features from nanoscale to microscale. The sample chamber has a large inspection space (250 x 250 mm) and advanced, low-noise turntables for stage rotation and sample translation. These features provide a stable and reliable performance, enabling users to work with larger fields of view and observe intricate details. The advanced imaging unit uses a patented tungsten filament design and long-life shields to protect the SEM against drift and increase the durability of the machine. In addition, the tool maintains a high-resolution magnification up to 5,000X, making it suitable for detailed studies and intricate samples. The in-built software also includes a range of toolsets, such as image registration and image stitching software, of which allow users to construct 3D images of their samples. With this capability, users can create detailed accurate images and monitor the surface topography of their specimens. HITACHI S-3000 N is also equipped with a wide range of analysis capabilities, including elemental analysis and X-ray mapping. It is designed to enable users to perform fast, accurate characterization of the sample's internal structure and fine details. Moreover, the integrated HITACHI E-SEM software suite makes the asset easy to use, as it streamlines user operation, from sample preparation to reporting of analysis results. This software allows users to control the model efficiently and easily. Overall, S 3000 N scanning electron microscope combines precision and power to enable users to observe and analyze their specimens in the finest detail. With its superior shielding and superior imaging capabilities, this powerful equipment is an invaluable tool for researchers, industrialists, and other professionals working with a wide range of materials.
There are no reviews yet