Used HITACHI S-3000N #9189738 for sale

HITACHI S-3000N is a scanning electron microscope (SEM) featuring high resolution capabilities and aimed at use in both academia and industry. It is equipped with an advanced, room temperature secondary electron (SE2) detector, giving an optimized image quality and superior image resolution. This equipment also features several automated functions that reduce the time needed to set up and analyze images. HITACHI S-3000 N is built to last and is highly reliable and low-maintenance. The machine has a 30kV cold cathode electron source and a three-stage condenser and objective column configuration. This allows for smaller lenses to be used with finer beam currents, resulting in improved image resolution. Additionally, there is a cross-field corrector and a small spot imaging mode, allowing the machine to image samples that may be more sensitive to the electron beam. S 3000 N has a fast, high-precision scanning system which can achieve step resolutions of 0.02 nm. This enables accurate analytical data on sample sizes ranging from microns to nanometers. In addition to the standard image analysis functions, the unit has also been enhanced with features such as fast surface image scanning and region of interest scanning. HITACHI S 3000 N also features an innovative machine for specimen control, labeled the SE-Sigma Control Tool. This asset provides accurate, linear movements for the anatomical stage, the sample changer, and the stage rotator. This helps to ensure a repeatable, accurate specimen positioning over multiple scans. Finally, S-3000N includes a state-of-the-art beam irradiation method, optimized for low-energy electrons. This promotes sample protection from meltback and charging effects. The instrument also has several automated cleaning routines, designed to reduce build-up on the column lens and other surfaces. Overall, S-3000 N is an advanced, reliable microscopy model, capable of providing images with high resolution and superior image contrast. The automated tools and user-friendly interface make the equipment easy to use, while the innovative beam irradiation methods and specimen control system helps to ensure optimal sample protection and repeatable, accurate analysis.