Used HITACHI S-3000N #9243774 for sale

HITACHI S-3000N is a scanning electron microscope (SEM) designed for high-resolution imaging and surface analysis of a variety of samples. It utilizes secondary electrons, back-scattered electrons, X-ray signals, and optical signals to observe specimen surfaces in high magnification. The SEM is built with a high vacuum column for precise sample orientation and observation. It has a working distance of up to 285 mm and allows for a wide range of specimen specimens up to 100mm in diameter. The microscope utilizes column-cooled E-gun technology with the ability to reach a resolution of 1.5 nm. This technology is capable of capturing high-resolution images and allows for maximum imaging area. HITACHI S-3000 N features a unique detector design to further enhance its performance. The multichannel detectors are capable of handling large samples and are equipped with an "automatic gain regulation" (AGR) mode. This advanced control system is designed to maintain optimal image quality no matter the specimen observation conditions. S 3000 N also features an automated sample alignment system (ASA) which allows for easy sample loading and alignment. Furthermore, it is equipped with an in-column Deflection Lens (DFL) to monitor the electrons at all times. This ensures optimal sample analysis and surface imaging. S-3000 N is also built with a variety of imaging modes, including conventional, TEED, digital imaging, spot analysis, and scanning. It also features a digital image processing system, making it ideal for TEM imaging. Overall, S-3000N is a powerful and versatile scanning electron microscope that can be used to analyze a variety of samples with unparalleled precision. Its advanced features and technology make it the ideal choice for observation of surface structures, as well as 3D imaging and sample analysis.