Used HITACHI S-3000N #9249990 for sale

HITACHI S-3000N is a scanning electron microscope (SEM) that combines superior optical performance with powerful analytical capabilities to enable high-resolution imaging and analysis of sample materials. It utilizes an electron beam to scan the sample's surface and collect data, with high-quality images having resolutions as low as 0.1nm. HITACHI S-3000 N is equipped with a wide range of features, including a large table stage with a vacuum port and an extremely sensitive everhart-thornley detector, which allows for much better detection of secondary electrons than earlier SEMs. The everhart-thornley detector also enables higher magnification images with improved contrast and resolution. The microscope has a built-in data processing system that allows for rapid analysis of images and data. S 3000 N utilizes several types of electron gun designs and offers a selection of objective lenses, depending on the requirements of the application. The zoom lenses can provide a magnification of up to 3000x. The microscope also features a displacement detector that can be used to analyze images with nanometer-scale accuracy, as well as an advanced artificial intelligence system that enables automated image processing. S-3000 N has a highly efficient gas-flow system to provide a clean, stable working environment and to reduce sample contamination. It also offers a broad range of analysis and imaging modes, allowing for accurate analysis of various types of samples. In addition to its imaging and analytical capabilities, HITACHI S 3000 N also offers a range of optional accessories, such as an energy dispersive spectrometer, which can provide elemental analysis of samples, as well as a high speed scanner for faster data acquisition. S-3000N also has software tools providing tools for 3D imaging and analysis. In conclusion, HITACHI S-3000N is an advanced scanning electron microscope that offers powerful analytical and imaging capabilities for a wide range of applications. It combines high-resolution imaging and powerful analytical capabilities, with advanced features and optional accessories, to enable accurate data acquisition, analysis and imaging of samples.