Used HITACHI S-3000N #9314032 for sale

HITACHI S-3000N scanning electron microscope (SEM) is a high-performance imaging instrument used to observe the shape, structure, and composition of materials at a microscopic level. This SEM has a long working distance and a wide field of view, allowing for detailed observation of biological and inorganic specimens. HITACHI S-3000 N is equipped with a cold field emission gun (FEG) within the electron column, which can generate a high beam current of 300 μA and a high acceleration voltage of 20 kV. This high beam current and voltage allows for clear observation of nanometer-scale structures and details such as grain boundaries, precipitates, and other areas of interest. Additionally, the high beam current allows S 3000 N to achieve high resolution images and images with exceptional depth of field. HITACHI S 3000 N has a variety of imaging modes, such as secondary electron, backscattered electron, and tilt imaging modes. The combination of these different modes provides the user with up to four simultaneous images that are taken at different angles. This allows for high contrast, ultra-high-resolution imaging of complex specimen structures. In order to maximize imaging efficiency, S-3000 N can be operated with a low vacuum of 10-2 Pa and programmable stage with a high degree of accuracy of 0.3 μm. This combination helps to minimize beam movements and maximize image sharpness. S-3000N also features an automated particle analysis system, which can be used to extract quantitative data from a large volume of images. This helps to reduce the time and cost associated with manual particle analysis. HITACHI S-3000N's modular design also provides flexibility for future upgrades and for custom configurations for specialized applications. For example, it can be easily integrated with a range of accessories, such as automatic sample changers, temperature controllers, and live biological observation units. Overall, HITACHI S-3000 N is a high-performance scanning electron microscope that is capable of capturing detailed images of samples at the nanometer scale. Because of its advanced features and modular design, it is an ideal instrument for various imaging and analysis applications such as failure analysis, life science research, semiconductor analysis, and education.