Used HITACHI S-3000N #9356366 for sale

HITACHI S-3000N is an ultra-high resolution scanning electron microscope (SEM) designed for detailed analysis and imaging of various surfaces. This model is equipped with improved optics, providing a resolution of down to 2.2 nm, making it ideal for nanoscale imaging and analysis. This model is also equipped with an ultra-stable electron gun which allows for enhanced imaging stability and repeatability, which is necessary for accurate analysis. The instrument offers an in-lens secondary electron detector, which is capable of providing information about the local topography of the sample surface. The microscope is also equipped with a backscattered electron detector, which is capable of providing information about atomic composition of the sample. To further enhance the performance of the SEM, the device has automated working distance control, ensuring that the optimum magnification can be obtained for a given sample. In addition, HITACHI S-3000 N is equipped with a high-sensitivity EDS equipment, which can provide elemental analysis of the sample with high levels of accuracy. To increase the flexibility of the instrument, multiple gas-injected chambers are installed. With this, the user can select different gas mixtures, such as low-pressure vacuum or high pressure, in order to increase the resolution of the system or prevent charging of the sample. In addition, the instrument features an image analysis unit which allows for digital image processing. This machine is designed to provide powerful tools for image enhancement and analysis in order to aid in the interpretation of image features. Finally, the work flow of S 3000 N is designed to be layout simple and efficient. This allows users to quickly operate the instrument and process samples in a simplified manner, while still gaining accurate and reliable results.