Used HITACHI S-3000N #9401346 for sale

HITACHI S-3000N is a scanning electron microscope (SEM) that combines cutting-edge imaging technology with user-friendly operation for a powerful microscope that is ideal for a variety of applications. With a high resolution of 1.5nm and maximum magnifications of up to 300,000x, HITACHI S-3000 N provides unparalleled images of samples from fields including biology, materials engineering and semiconductor failure analysis. Through the use of an advanced array of imaging hardware, including the Everhart-Thornley (ET) detector and an electrometer, S 3000 N is capable of acquiring high-accuracy images at an even higher speed than previous models. In addition to its imaging capabilities, S-3000 N offers a wide range of operating functions. The included automated automated sample preparation stage helps to ensure that samples are in the correct position and focus before image acquisition and offers a wide range of specimen alignment settings, including automated displacement and a variety of motorized scanning parameters. The microscope is also equipped with the latest automatic sample exchange (ASE) technology, allowing highly accurate specimens to be exchanged quickly and easily. Furthermore, S-3000N is capable of carrying out multiple tasks in sequence, allowing for efficient and rapid imaging for all types of experiments. The intuitive user interface allows for both novice and expert users to quickly become familiar with operating HITACHI S 3000 N. With its easy-to-use software, the operation of the microscope can be tailored to the user's preferences. Its large, high-definition monitor offers an unrivaled view of the electron images, while a variety of remote control options allow further flexibility. All of these features work in tandem to make HITACHI S-3000N scanning electron microscope a powerful imaging and analytical device for a wide range of applications. With its high resolution and rapid scanning functions, HITACHI S-3000 N is capable of providing the highest quality images for forensic analysis, material and component failure studies, and industrial research.