Used HITACHI S-3200 #9243691 for sale

HITACHI S-3200 is a scanning electron microscope (SEM) designed for imaging samples at high magnifications. With a maximum resolution of 1.5 nanometers, this SEM is capable of observing nanoscale features. Its observation range can be extended to up to 200,000X magnification. S-3200 is equipped with backscattered and secondary electron detector (BSD and SED) systems to capture images of both light and heavy elements in the sample. The BSD and SED systems are combined with a patented low-temperature filament that allow the microscope to capture low-vacuum signals. This improved signal quality and enhanced built-in measurement functions enable quick measurement of sample dimensions without manual stage adjustments. HITACHI S-3200 also features an efficient electron-optical column designed to accurately image a sample at high magnification. Employing a multi-stage condenser optical system consisting of crossbar deflectors and electrodes, it adjusts the beam shape to align with the sample. In addition, a magnetic field has been integrated into this system to eliminate any aberration of the electron beams and achieve higher resolution imaging. S-3200's design incorporates two objectives, enabling comprehensive imaging. The first objective is a top-view objective for surface inspection. It provides a greater depth of focus and improved resolution, allowing for top-down and angled imaging. The second objective is a two-beam BSD objective, designed for two-beam imaging and increased signal gaps. HITACHI S-3200 also employs a low drift stage design to minimize shaking and vibration during observation. This design utilizes a pneumatic element and temperature-controlled air-flow to keep the sample stable during observations. S-3200 operates under a wide range of environment conditions. Its auto-tune function can quickly adapt to different temperatures/humidity levels, ensuring accurate operation at all times. HITACHI S-3200 also has an existing stage setting algorithm to rapidly switch between working environments when needed. In addition, S-3200 offers advanced data acquisition and analytics capabilities. It supports fast image capture, automation, and has an intuitive image management system. It also features 3D automation and image manipulation capabilities, making it easier to scrutinize nanoscale sample features. Overall, HITACHI S-3200 is an advanced scanning electron microscope designed for imaging samples at high magnifications. It offers a wide range of imaging capabilities including backscattered and secondary electron detectors, low drift stage design, and advanced data acquisition and analytics. Furthermore, S-3200's auto-tune and stage setting algorithms allow for an extremely stable operation under a variety of environmental conditions. Thus, HITACHI S-3200 is an ideal choice for nanoscale imaging applications.