Used HITACHI S-3200H #152573 for sale
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ID: 152573
Wafer Size: 5"
Scanning Electron Microscope (SEM), 5"
Type: W
IR Chamber scope
STS X-Stream imaging system
Resolution: 3nm at 30kV
Motorized.
HITACHI S-3200H is a top of the range scanning electron microscope, designed for high precision imaging and measurement of a wide array of specimens. It features a large, four-quadrant Schottky field emission gun, delivering high spatial resolution imaging even at low accelerating voltages. The gun has integrated lower noise design, reducing background noise to give a clear image in the micrograph. The microscope is versatile for many applications due to its choice of imaging modes such as secondary electron imaging and backscatter electron imaging (BSE). Secondary electron imaging uses a detector to collect electrons ejected from the specimen surface as a result from the primary electrons used to excite the sample. This mode reveals surface features in detail. BSE allows the user to see the topography of the specimen, as higher energy electrons penetrate into the sample and interact with atomic nuclei giving indications of the specimen's composition. S-3200H utilises a parallel-operation gun and detector housing with three types of detector available to provide the ultimate in versatility. Detectors include a small spot detector, scanning transmission detector and a side-scattering detector. The gun column also features the latest current compensation technology which reduces noise from the electron beam and increases clarity of the image. HITACHI S-3200H also offers unique analytical capabilities to aid specimen analysis, thanks to its Energy Dispersive X-Ray spectrometer (EDX) detector. This device enables the collection and analysis of x-ray signals generated in the sample when primary electrons interact with the specimen. It enables the user to reach a deeper level of sample information and make sophisticated chemical analysis of their sample. Finally, sample holders are available to suit a variety of specimen types and the user can select any of the 3 optical stages to best suit their sample size. The sample table height can be adjusted between the gun and the sample to create a flat field of view, ensuring that clear and accurate images are achieved. In conclusion, S-3200H is a powerful and versatile tool for imaging and analysis, providing high resolution images as well as chemical analysis for a wide range of specimens.
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