Used HITACHI S-3200N #9208242 for sale

HITACHI S-3200N is an advanced scanning electron microscope (SEM) designed for probing the micro- and nanostructures of a variety of materials. It incorporates an advanced, digital-scanning equipment that has a built-in stage and a high resolution detector, resulting in high image contrast, improved image resolutions, and a greater depth of field. HITACHI S 3200 N includes a high-throughput, auto-stage system for automated repeatable sample mount and stage scanning. A variety of advanced imaging techniques can be used with the microscope including high contrast secondary electron imaging (SEI), backscatter electron imaging (BSEI) and analytical scanning, including electron dispersive spectrometry or energy dispersive spectrometry (EDS). S-3200N allows users to take high resolution images with a variety of objective lenses, from 0.5 to 1,000,000x magnification, and a working distance of between 0-10mm. The lens calibration unit of S 3200 N ensures that these images are true and accurate. HITACHI S-3200N has a full suite of scan control features that enable users to adjust the essential SEM parameters to optimize image acquisition. An automated calibration procedure is used to ensure the vacuum is operating optimally. The microscope has a noise suppression machine and dynamic filtering technology that reduce the amount of noise interference. The Stage Control Tool of HITACHI S 3200 N enables automated navigation with repeatable precision in the x,y,z axes in nanometer increments. The stage also has a tilt and rotation function that allows for precise sample positioning in the x and y axes, and rotational sample positioning for surface imaging. S-3200N also includes an auto-count function that can accurately count particles in a user-defined area and sample. This helps in analyzing particle distributions in the sample, and helps in understanding particle size distribution and porosity. S 3200 N is capable of taking multiple images from one sample automatically. This function can be used to monitor surface changes over time or to create a complete 3D image of the sample surface. The microscope can also be connected to a PC for image processing, analysis, and data/result sharing. HITACHI S-3200N is designed for high performance scanning electron microscopy and offers advanced imaging capabilities on a variety of materials and samples. With a built-in stage and automated systems, HITACHI S 3200 N is an ideal choice for precise nanoscience research.