Used HITACHI S-3200N #9394044 for sale

HITACHI S-3200N scanning electron microscope (SEM) is a high-performance, high-resolution microscope designed to offer superior imaging capabilities for a variety of specimens. HITACHI S 3200 N utilizes secondary electrons (SE), which are generated when a focused electron beam interacts with matter. These electrons are used to generate the SEM image, allowing for high-resolution images with excellent contrast and detail. The electron beam can be scanned over the sample by moving the specimen stage and the collected electrons are measured to generate the SEM image. S-3200N also has an array of electron-optical components and options to enable imaging on a wide range of specimens. These include digital imaging options, including BS-LED and FN-DFE digital imaging systems, and optical components such as high transmission electron lenses, emission detectors, and a variety of backscattered electron detectors. S 3200 N features an automated sample exchange capability, enabling rapid analysis of multiple samples. It also includes an automated stage with a built-in 3-axes motorized stage, allowing for accurate sample positioning and scanning. HITACHI S-3200N is also available in a "dual-column" design, allowing for high resolution images with extremely low noise levels. This feature also allows for optimized beam outputs, providing uniform beam intensity with focus, astigmatism and spot size control for optimizing the SEM image. HITACHI S 3200 N features proportional integration control, providing accurate control over the electromagnetic deflection circuit. This allows for the use of multiple electron detector elements for simultaneous imaging and analysis. S-3200N features an atomically flat sample preparation method, allowing for the highest possible resolution and low contamination levels. It also offers a choice of sputter coating, carbon evaporation and ion-beam assisted deposition for added versatility. S 3200 N has a low power requirement and is highly compatible with alternative vacuum environments, making it an ideal choice for use in various semiconductor and biological applications. Overall, HITACHI S-3200N SEM provides superior imaging capabilities for a variety of samples and is a valuable tool in scientific research. With its high-resolution capability, flexible automation and atomically flat sample preparation, HITACHI S 3200 N is the ideal choice for researchers seeking the best imaging available.