Used HITACHI S-3400N Type II #293604796 for sale

HITACHI S-3400N Type II Scanning Electron Microscope (SEM) is a high-performance, multi-discipline tool that is designed to meet the needs of a wide variety of research and industrial applications. With a wide range of imaging and analysis capabilities, S-3400N Type II offers enhanced imaging performance and superior flexibility, making it a valuable asset for those needing high resolution imaging for their research and industrial experiments. HITACHI S-3400N Type II SEM is a high-vacuum secondary electron detector with a unique digital imaging and analysis equipment. It utilizes an in-lens double field condenser, an energy-dispersive X-ray detector, and a five-axis stage. This system enables high resolution imaging in a wide variety of materials, including metals, ceramics, semiconductors, and other materials. S-3400N Type II SEM has a high-magnification range of up to 7.2 million x, allowing the user to view small details clearly and accurately. The four-element objective lens offers high-resolution imaging of small particles and specimens with a wide field of view. The high-resolution imaging and scanning area of HITACHI S-3400N Type II SEM incorporates a 3-D mapping unit that offers an extensive range of automated analysis functions. Its 3-D mapping machine is able to acquire images from multiple angles and measure the microstructure of a sample. S-3400N Type II SEM features a variety of automation features, such as auto focus and auto quench, that improve its efficiency and productivity. Its auto focus and auto quench functions enable automated sample inspection, analysis, and imaging. HITACHI S-3400N Type II also features a collision-protection tool for samples. It can detect potential collisions and safeguard delicate sample surfaces from potential damage. S-3400N Type II scanning electron microscope is a versatile and reliable analytical tool that can be used for a variety of research and industrial applications. Its advanced imaging and analysis capabilities, wide range of magnification, and comprehensive automation features make it an ideal choice for users seeking a high-performance instrument. With its enhanced imaging resolution and flexibility, HITACHI S-3400N Type II SEM is essential for anyone needing a high-performance imaging device with excellent capabilities.