Used HITACHI S-3400N Type II #9274230 for sale
URL successfully copied!
HITACHI S-3400N Type II is a highly advanced scanning electron microscope (SEM) developed by HITACHI High Technologies Corporation. This instrument, and its earlier predecessors, have been used to produce research-grade images in the fields of nanotechnology, semiconductor fabrication and material science. The system is engineered with a solid-state electron source that provides a set of emission modes that can be tuned for operation at low and high current levels. The backscattered electron (BSE) detector can also be configured to produce high-resolution images when operating at low current levels. The system also utilizes an ever-improving range of features and accessories, such as an energy filter that improves the contrast and resolution of images whilst providing results over a wide range of magnifications up to an impressive 20000x. S-3400N Type II has a very robust and reliable design and is suitable for a range of applications for both research and commercial use, including the analysis of surfaces, samples and related materials. Its field emission gun electron beam is capable of delivering low-voltage beams down to 3 kV which enables submicron resolution images. The image resolution is complemented by a non-coplanar scanning lens, which ensures that a range of sample geometries can be sampled, without introducing artifacts or damaging the sample in the process. The instrument also has an automated chamber for managing the sample environment. This can include gas flow and pressure, making it possible to work with conductive and non-conductive samples. The chamber also features an adjustable cooling device, allowing for precise sample temperatures for improved performance. In short, HITACHI S-3400N Type II is an advanced and reliable scanning electron microscope. With its wide array of features and accessories, this instrument is capable of providing the highest resolution images, enabling researchers and technicians to perform high-end analysis with optimal performance. Additionally, the system is very robust and reliable, making it more suited for longer-term use.
There are no reviews yet