Used HITACHI S-3400N #293602464 for sale

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ID: 293602464
Vintage: 2008
Scanning Electron Microscope (SEM) Pump EDS PC Power supply Air receiver HORIBA 7021H FE-SEM 2008 vintage.
HITACHI S-3400N is a scanning electron microscope (SEM) which features superior image quality and high resolution that is ideal for analyzing the surface of a specimen. It provides a wide range of capabilities including 3D imaging, advanced metrology, and electron backscatter diffraction (EBSD). The microscope is equipped with a high-end column that uses a six-section field emission gun to deliver an extended field of view (up to 5 cm) at high magnification. This enables the operator to analyze samples at high resolutions, up to 1.5 nm with secondary electron imaging (SEI) and 5 nm with critical point dry (CPD) imaging. HITACHI S-3400 N has 4 main imaging modes that allow for optimal results depending on the sample requirements; SEI, CPD, backscatter electron imaging (BEI), and electron energy loss spectroscopy (EELS). In SEI mode, secondary electrons produced by the specimen are detected by the electron detector and used to create an image. CPD mode is used when a high resolution imaging is needed, where samples are imaged in a dry chamber to reduce contamination. The BEI mode creates an image from backscattered electrons that have bounced off the specimen surface. This mode is used for samples with low contrast, in order to make the finer details visible. The EELS mode is for determining the chemical composition of a specimen. This is accomplished by detecting and measuring the energies of electrons that have been scattered off the specimen. This SEM is also enhanced with a variety of features including a long working distance (LWD) lens that reduces the effect of aberrations, a high energy resolution energy filter, and a stage tilt mechanism. The high resolution energy filter enables precise energy selection of electrons providing better analysis capabilities and improved imaging. The stage tilt mechanism allows for precise alignment of the specimen visually or through charts and graphs. S 3400 N provides the perfect platform for both routine and complex analysis, making it a good choice for a variety of laboratories.
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