Used HITACHI S-3400N #293606246 for sale
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ID: 293606246
Vintage: 2005
Scanning Electron Microscope (SEM)
Detector: SE, BSE Detector
Rotary pump
Air compressor
LCD Monitor
Zig-zag capture
3D-Viewer
Operating system: Windows XP Pro
2005 vintage.
HITACHI S-3400N is a high resolution scanning electron microscope (SEM). It includes field emission gun (FEG) type electron optics, wich feature high brightness, high resolution and low aberration, making HITACHI S-3400 N suitable for a wide range of applications, including imaging of microstructures, compositional analysis, elemental analysis and measurement of physical parameters. S 3400 N offers a high level of performance and image quality. Its ultra-high resolving power enables the observation of fine microstructures with superior depth of field and low noise characteristics. The low aberration electron optics equipment is capable of exact focusing, enabling the observation of objects with greater detail. S-3400N is equipped with a sophisticated auto-focusing system, allowing automaticl level optimization of sample surface and image focus. The unit also features intelligent image processing, allowing the user to easily adjust the image parameters for optimum results. HITACHI S 3400 N includes an integrated digital machine for simple and efficient imaging. It features an adjustable field of view (FOV) for scan evaluation and can perform several functions such as automated scanning, imaging parameter adjustments and shooting of single or multiple frames. Automatic image alignment and stitching can also be used for the fast and efficient analysis of large sample surfaces. S-3400 N features an advanced vacuum tool to provide a stable and constant atmosphere for imaging. This is essential in order to prevent any contamination or noise interference. An automatic thermal drift compensation asset helps maintain a constant imaging plane, while a temperature control model prevents generation of thermal noise. In conclusion, HITACHI S-3400N scanning electron microscope is an advanced, high resolution instrument capable of providing excellent imaging results for a variety of applications. It combines high-resolution electron optics with a sophisticated auto-focusing equipment and digital imaging system for precise and accurate imaging. The advanced vacuum unit ensures a stable and clean imaging environment, while the temperature control machine prevents thermal noise. All these features make HITACHI S-3400 N the perfect choice for a variety of imaging tasks.
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