Used HITACHI S-3400N #293606247 for sale

HITACHI S-3400N is a scanning electron microscope designed for observation and analysis of the surface structure of samples. It is a high-resolution, high-performance instrument with a large depth of field and high precision electro-optical alignment for accurate imaging. HITACHI S-3400 N features a large field of view for better detection of surface features and improved contrast. It has an accelerate voltage of 0.5 to 30kV which allows for more accurate analysis of samples. Additionally, the equipment has a large depth of field for better imaging of finer structures. The microscope is equipped with a scanning electron microscope (SEM) detector which allows the user to capture images with higher resolution and contrast. It is also equipped with a high-resolution Everhard-Thornley-type backscattered electron (BSE) detector to provide high-contrast backscattered images. Both detectors are equipped with an LED illuminator to optimize light intensity for brighter and clearer images. S 3400 N has a fully computer-controlled stage that allows for precise loading, positioning, and focusing of samples. The microscope also has a high-speed motorized focusing mechanism for quick and accurate imaging of samples. This together with the computer-controlled stage allow for fully automated operation which provides incredible accuracy and repeatability for sample examination. Additionally, the microscope is equipped with an advanced imaging software for full control over specimen parameters, data analysis, and reporting. S-3400N has a simple, user-friendly interface and intuitive menus and controls. Additionally, the system is compatible with Windows-based PCs and can be operated via the integrated joystick unit. This makes the microscope easy to use even for beginners. Overall, S-3400 N is an advanced scanning electron microscope machine that provides excellent resolution, contrast, and accuracy for analysis of samples. Its high-speed focusing and automated operation allow for highly precise imaging and data analysis, giving users the ability to perform detailed sample research and analysis.