Used HITACHI S-3400N #293606248 for sale

HITACHI S-3400N Scanning Electron Microscope (SEM) is a popular instrument used for imaging the micro or nano-scale structures of samples. The microscope uses an electron beam to scan the sample and image the details of its surfaces. This microscope is a low vacuum system and can image samples in a range of modes, such as secondary electrons, backscatted electrons and X-rays. HITACHI S-3400 N has a resolution of 1.3nm in secondary electron mode and 0.2nm in backscattered electron mode. The field of view that it is capable of imaging is 20mm×20mm and the maximum magnifications achievable are 40,000x in secondary electron mode and 400,000x in backscattered electron mode. The electrons are accelerated to an energy of 10kV, with an energy spread of 3.2%. S 3400 N is a fully automated system, allowing for quick and easy adjustment of the stage and the condenser lens, as well as region specific imaging and control of the resolution, contrast and brightness. The instrument has the flexibility to easily switch between different imaging modes. S-3400 N offers extended capabilities such as a charged and uncharged secondary electron detector, automatic stigmation adjustment and video display and recording. An optional EDS detector adds the ability to image samples with Energy Dispersive X-Ray Spectroscopy (EDS). The excellent performance of S-3400N is further enhanced by its easy-to-use interface, which allows for the operation of multiple scan modes quickly and easily. The user-friendly software package provides a number of handy features such as sample memory, scripting, search functions and various other customization options. In conclusion, HITACHI S 3400 N is an excellent choice for a scanning electron microscope as it is capable of imaging a wide range of samples in various modes, with high resolution and maximum magnifications. Its advanced features, ease of use and superb imaging performance make it the ideal choice for any lab setting.