Used HITACHI S-3400N #293618150 for sale
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ID: 293618150
Vintage: 2007
Scanning Electron Microscope (SEM)
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2007 vintage.
HITACHI S-3400N is an advanced scanning electron microscope (SEM) designed to provide high-resolution imaging of various sample types. The instrument is capable of capturing detailed images of samples at magnifications of up to 50,000x and features a vacuum chamber with a view of up to 44 degrees. HITACHI S-3400 N is equipped with a variety of features, including a high-powered detector, microprocessor-controlled electronics, and a proprietary "smart" software package. S 3400 N utilizes a tungsten filament electron gun to generate a focused electron beam. This beam, guided by a scanning deflector, is used to irradiate the sample surface. The secondary electrons generated as a result of this interaction are then detected by the instrument's detector. The detector, a state-of-the-art feature of S-3400 N, is equipped with a built-in scintillator, allowing for the accurate quantification of detected secondary electrons. This allows for highly detailed imaging of samples in both surface and subsurface regions. The software package included with HITACHI S 3400 N provides an easy-to-use interface for controlling the instrument. This package, cleverly named "SmartScope", allows the user to make adjustments to the electron gun voltage, scan size, and scanning speed. Additionally, SmartScope allows the user to acquire multiple different images of the same sample area and quickly compile them into a single image. This ability to customize imaging settings, combined with the powerful magnifications offered by S-3400N, make the instrument an extremely versatile and valuable tool in any laboratory. HITACHI S-3400N is highly reliable, with integrated cooling systems ensuring that the instrument and specimen can be used safely and without performance degradation. It is also intuitive, with well-labeled controls and a clear user interface. Furthermore, the instrument is adjustable to accommodate specimens from a variety of sizes and types. In conclusion, HITACHI S-3400 N is an advanced, highly versatile scanning electron microscope designed for high-resolution imaging of various sample types. With its tungsten filament electron gun, robust detector, and intuitive software package, S 3400 N offers unparalleled performance and ease of use in any laboratory.
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