Used HITACHI S-3400N #293639327 for sale

HITACHI S-3400N
ID: 293639327
Scanning Electron Microscope (SEM).
HITACHI S-3400N scanning electron microscope (SEM) is a versatile, high-performance imaging instrument. It is designed for both routine and specialized electron imaging applications, such as advanced materials inspection, failure analysis, advanced imaging, and nanotechnology. The improved resolution and contrast of HITACHI S-3400 N makes it one of the most advanced imaging systems available. S 3400 N is designed to deliver high-resolution images at affordable prices. The advanced imaging design of S-3400N allows real-time image acquisition and a full range of image details. Images are produced with an oscilloscope, enabling measurements of objects down to 1nm. Additionally, the adjustable contrast and excellent field of view provides superb contrast and detail. The high-precision design of S-3400 N increases its usable imaging area, allowing for large area imaging capabilities and even greater image accuracy. The multi-mode controller and additional power supply controls provide ultimate reliability, responding quickly to changes in operating parameters. With the digital imaging system, images can be saved to be retrieved when needed. HITACHI S 3400 N has numerous automated capabilities, making it an ideal instrument for automated analysis and measurement. Its user-friendly HDTV camera and camera controller offer digital imaging enhancement and excellent resolution. Autodrive features, such as autofocus and autotrigger capabilities, make operation of the microscope effortless. The optional SEMline software makes operation of HITACHI S-3400N even more intuitive, allowing for quick and easy measurement and analysis of specimens. The robust construction and superior design of HITACHI S-3400 N make it one of the most reliable instruments on the market. Its environment sealed design, along with its high-vacuum construction, means S 3400 N can be used in harsh environments, providing optimum reliability for all types of sample preparation and observation. S-3400N scanning electron microscope is a versatile and reliable imaging instrument, offering excellent resolution and contrast at an affordable price. Its sophisticated design, advanced features, and digital imaging capabilities make it an ideal choice for both routine and specialized imaging applications.
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