Used HITACHI S-3400N #293653432 for sale

HITACHI S-3400N is a scanning electron microscope (SEM) with a field emission gun that allows for high-resolution imaging and analysis of both organic and inorganic samples. HITACHI S-3400 N includes a gun equipment that is coated with an electron barium insulation (EBI) coating, which significantly reduces surface charging during imaging. This prevents image fuzziness and allows for imaging of highly detailed samples. The gun system has excellent resolution capabilities with a dynamic range of 0.2 nanometres, allowing for unparalleled imaging of small structures with great clarity. S 3400 N also provides a range of accelerated voltage options, ranging from 0.01-20 kV, enabling imaging of a wide variety of samples. It also comes with an X-Y stage that has a coarse and fine increment design, allowing for precise sample navigation and magnification. This stage also has an automatic return mechanism and a digital readout unit that displays the sample's exact position at all times. Additionally, HITACHI S 3400 N includes an in-lens detector that renders highly realistic images with three magnification capabilities, higher magnification power, higher accumulation of electrons, and a polarization detector that has a resolution of 1.2 nm and both X-ray and electron sensitivity. This allows for the production of three-dimensional images which can be used to analyse a sample's internal surface structure and chemical composition. S-3400N is equipped with a low-vacuum machine that has a residual gas level of less than 10-10 torr and an ultra-high vacuum tool with a residual gas level of below 10-11 torr. This allows for the built-up of an ultra-high vacuum in short periods of time, as well as significant reductions in particle scattering and surface charging. S-3400 N also has a large chamber which allows for more precise sample placement and manipulation, an automated operation asset which enables the user to save settings and recall them for rapid imaging, and a wide array of accessories and component options to further customize the SEM for specific imaging and analysis tasks. Overall, HITACHI S-3400N is an advanced scanning electron microscope capable of providing high-resolution imagery and analysis of both organic and inorganic samples, enabling detailed analysis of structural features and chemical compositions. HITACHI S-3400 N features several unique features including an EBI gun model, a powerful in-lens detector, and a powerful low-vacuum and ultra-high vacuum equipment, ensuring that users are able to obtain accurate and reliable results.