Used HITACHI S-3400N #293661076 for sale

HITACHI S-3400N Scanning Electron Microscope (SEM) is a high-performance instrument designed for advanced scientific and industrial research and analysis. It is intended for operation in a wide range of fields, including materials science, process control, biomedical, and semiconductor research. HITACHI S-3400 N is designed to combine ultimate performance with ease of operation. Semi-automated functions are incorporated to reduce time and effort required in the sample preparation and analysis process, while the continuous measurement capability ensures results accuracy and repeatability. S 3400 N utilizes a scanning electron column consisting of a field emission cathode, an accelerating voltage of 0-30 kV, and an arcing detector which allow for low-vacuum and low-noise imaging. With these components, the equipment is able to achieve a resolution of 1.2 nm at a magnification of 50,000X and an acceleration voltage of 30 kV. The imaging of S-3400N is accelerated by the inclusion of an in-column Energy Dispersive X-Ray (EDX) analysis system. This EDX analysis unit provides quantitative measurements of elements found within the sample, enabling a more comprehensive picture of the composition of the material being studied. HITACHI S 3400 N can also be used to evaluate the shape and structure of specimens by utilizing a Resistor Quantifiner (RQ). The RQ combines a few different digital algorithms with dark field imaging, allowing quantitative analysis of surface relief, feature size and shape, and other parameters to be performed with minimal effort. In order to ensure the safety of the operators of S-3400 N, the machine is equipped with several safety features. These features include a user-activated, 9mm thick Lead Alloy Beam Shield which slides in front of the SEM column upon activation, minimizing specularly reflective stochastic X-Ray radiation which can cause skin damage. The SEM is also equipped with a low-noise shunt regulator and ion trap tool, which prevent emitted electrons from escaping and causing harm to the user. HITACHI S-3400N also provides integration with a variety of software, allowing for data processing and analysis of the images and EDX measurements. This software integration allows for the data to be stored, processed, and shared with a variety of systems. To ensure optimum performance of HITACHI S-3400 N, regular maintenance is recommended. This includes periodic cleaning of the vacuum components (image column and EDX detector) to remove any build up of debris that can hinder the performance of the asset. In summary, S 3400 N Scanning Electron Microscope provides high-performance imaging capabilities, excellent energy dispersive X-ray (EDX) analysis capabilities and incorporates numerous safety features. Combined with easy-to-use automated functions, S-3400N facilitates user efficiency and allows for optimum throughput of the research results.