Used HITACHI S-3400N #293800494 for sale

HITACHI S-3400N is a scanning electron microscope (SEM) that is widely used in scientific and engineering applications. This scanning electron microscope utilizes an electron beam to produce images of a sample surface from which its structure, elemental composition, and chemical state can be determined. The basics of HITACHI S-3400 N are comprised of an electron gun for generation of the electron beam, lenses to focus the beam, a deflector to scan the sample in a raster pattern, and a detector to transform the electron beam into an visual image. The device can magnify samples up to 300,000 times. This particular model also boasts advanced imaging capabilities such as automatic alignment, high speed imaging and detection, and a variety of measuring functions such as three dimensional analyses. S 3400 N uses a field emission gun as its electron source. This gun is able to generate a high beam current of up to 10mA with a minimum working distance of 0.13mm and a magnification range of 10 to 300,000 times. The gun also features several lenses for optimal beam condensation and deflection. The deflector in S-3400 N is a high-resolution, high-speed high-voltage type capable of high-speed data collection over a wide range. It also has a highly-accurate automatic alignment that allows images of moving samples to be captured accurately. Furthermore, the scan limit and range can be operated independently of the gun, which ensures high-precision imaging. The detector in S-3400N is designed to convert the electron beam into a visual image quickly and accurately. It is equipped with a multilateral deflector plate, which can be used to display the detected electrons in different directions depending on the sample type. This allows for efficient imaging of features such as particles and crystalline structures. HITACHI S 3400 N scanning electron microscope is a powerful tool that provides extremely high resolution images with fast motion and high accuracy for scientific and engineering applications. Its advanced features and lens system enable researchers to gain a detailed picture of the sample surface and its composition. The device provides an ideal solution for applications involving materials analysis, microelectronics, and many more.