Used HITACHI S-3400N #293808981 for sale

HITACHI S-3400N is a scanning electron microscope (SEM) that can be used for various applications, including materials research, failure analysis, and biological research. The microscope offers high-resolution imaging that is capable of resolving features as small as 0.5 nanometers. It has a vacuum chamber which helps to reduce electron scattering and improves image quality. HITACHI S-3400 N has a monochromatic X-ray detector which enhances the spectroscopic analysis capabilities. This allows researchers to run elemental, chemical and crystalline identification analyses with various sizes of samples. The detector has a very high sensitivity rate and can detect differences in structures down to the nanometer range. S 3400 N has a two-axis scan mechanism with a large 10 cm scan area. This facilitates easy adjustment of the sampling area and the resolution of the images acquired. The high-resolution acquisition can detect the slight boundary shifts or discrepancies between the sample and the rest of the specimen. The microscope also has an In-lens detector, providing high-fidelity images even in low vacuum or high humidity conditions. S-3400N has several contrast methods for collecting images, such as Secondary Electron Imaging (SEI), Backscattered Electron Imaging (BEI), Energy Dispersive X-ray Spectroscopy (EDS), and X-ray Fluorescence (XRF). It also has a source size control feature that enables expanded resolution and image contrast. HITACHI S 3400 N is an advanced scanning electron microscope that can be used for various research and analysis applications. It offers high-resolution imaging and several contrast methods for data collection. It has a monochromatic X-ray detector and an In-lens detector for high-fidelity images in low vacuum or high humidity conditions. It also has a two-axis scan mechanism and a source size control feature. S-3400 N is highly reliable and efficient and can be used for various materials and biological research applications.