Used HITACHI S-3400N #293830403 for sale

HITACHI S-3400N Scanning Electron Microscope (SEM) equipment is a state-of-the-art imaging solution for observing the microscopic features of a wide range of materials. The optimized tungsten filament electron system components are designed to deliver the highest detection efficiency and dynamic range in the shortest possible time. HITACHI S-3400 N solid state detector technology enables the capture of pictures with a dynamic range of greater than 100,000:1. In addition, the advanced low-angle viewing mode and a field emission gun provide imaging clarity to capture minute details. S 3400 N SEM unit includes advanced control software, which allows researchers to easily adjust the microscope settings while observing the sample. The software continuously optimizes the imaging parameters to achieve a high-quality picture. The graphical user interface makes it simple to determine the best imaging parameters for the observed specimen. HITACHI S 3400 N SEM machine also includes a fully computer-controlled incident electron detector, providing researchers with the ability to rapidly obtain the maximum resolution of the sample. This is especially useful in situations where time is of the essence, such as in industrial research applications or examining hard to reach areas. S-3400 N is equipped with a wide range of automated SEM features, providing relief from manual microscopy processes. These features include automatic focusing, automatic background leveling, automatic scanning, and automated image optimization. This reduces downtime and allows for faster and more accurate image capture. Finally, S-3400N SEM tool offers a wide range of accessories, including sample supports, thin-film holders, goniometers, and photomask holders. These accessories ensure the highest possible resolution from a wide variety of materials. Given its comprehensive list of features, HITACHI S-3400N is ideal for a wide range of materials and applications.