Used HITACHI S-3400N #9153016 for sale

HITACHI S-3400N is a scanning electron microscope (SEM) designed to provide high resolution imaging capabilities with excellent signal to noise performance. This advanced SEM is suitable for a wide range of applications, including nanoscale analysis, semiconductor device fabrication, and surface science. The advanced optical equipment of HITACHI S-3400 N employs an aberration-corrected Schottky field emission electron gun, enabling a beam current of up to 200 pA with a spot size of less than 5 nanometers. The unique high-precision scanning mechanism and patented deflector design ensure stable image formation, without image distortion and minimal image displacement. The knob-type multi-mode scanning allows for smooth scanning in all directions, and is easy to control, even with a single finger. S 3400 N comes standard with an energy dispersive x-ray spectroscopy (EDS) system, which enables elemental analysis and compositional mapping. The EDS unit is equipped with a newly developed X-TalTM ultra-thinSDD semiconductor detector, that provides excellent detection efficiency and low noise performance. The dynamic line scan feature enables fast digital image acquisition and analysis, while the real-time segment analysis and automated digital analysis enables fast and accurate results. The digital data acquisition machine of S-3400N supports a wide range of digital output formats, including BMP, JPEG, TIFF and other common formats. The digital data acquisition tool also supports remote control, allowing it to be operated from a separate computer. The computer can be used to control the microscope, capture and analyze images, adjust settings, and more. HITACHI S 3400 N is designed to provide a safe, ergonomic imaging environment. The microscope is enclosed in an electromagnetic shielding casing that reduces interference from external sources and protects the optical asset, as well as a honeycomb-like patterned cabinet that dampens vibration and protects the machine from external shock. The LED lighting model provides consistent illumination and helps to eliminate optical errors. The control panel is easy to operate and provides clear feedback for the user, and the equipment is equipped with an emergency stop switch to help ensure safety. S-3400 N scanning electron microscope from HITACHI is a versatile, reliable instrument capable of providing high resolution imaging and excellent signal to noise performance. Its advanced imaging system, EDS and digital data acquisition capabilities, as well as its intuitive, ergonomic design make it an excellent choice for researchers and engineers looking to push the boundaries of imaging technology.